專利名稱：Z-test result reconciliation with multiple

partitions

發(fā)明人：Mark J. French,Phillip Keslin,Steven E

Molnar,Adam Clark Weitkemper

申請?zhí)枺篣S11934042申請日：20071101公開號：US08232991B1公開日：20120731

專利附圖：

摘要：The current invention involves new systems and methods for computing per-sample post-z test coverage when the memory is organized in multiple partitions that

may not match the number of shaders. Shaded pixels output by the shaders can beprocessed by one of several z raster operations units. The shading processing capabilitycan be configured independent of the number of memory partitions and number of zraster operations units. The current invention also involves new systems and method forusing different z test modes with multiple render targets with a single or multiplememory partitions. Rendering performance may be improved by using an early z testingmode is used to eliminate non-visible samples prior to shading.

申請人：Mark J. French,Phillip Keslin,Steven E Molnar,Adam Clark Weitkemper

地址：Raleigh NC US,San Jose CA US,Chapel Hill NC US,Holly Springs NC US

國籍：US,US,US,US

代理機(jī)構(gòu)：Patterson & Sheridan, LLP

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